Search Results - Control Structures and Microprogramming~Control Structure Reliability
-
1
Authors:
Source: Leibniz Transactions on Embedded Systems; Vol. 3 No. 1 (2016); 01:1-01:20 ; 2199-2002 ; 10.4230/LITES-v003-i001
Subject Terms: Fault tolerance, Functional safety, PEARL, Embedded systems, Software engineering, Control Structures and Microprogramming~Control Structure Reliability, Testing, and Fault-Tolerance, Programming Languages, Language Constructs and Features, Computers in Other Systems, Real-time, Advanced Driver Assistance Systems, Space Flight
File Description: application/pdf
Relation: https://ojs.dagstuhl.de/index.php/lites/article/view/LITES-v003-i001-a001/lites-v003-i001-a001-pdf
-
2
Authors: et al.
Source: ISTI Technical reports, pp.1–18, 2001
Subject Terms: control structures and microprogramming: control structure reliability, Processors architectures: multiple data stream architectures ..Array and vector processors, Operating systems: reliability .. fault. Tolerance, Testing and fault. Tolerance .. Diagnostics, performance and reliability: reliability, testing and fault. Tolerance
-
3
Authors: Li, Junfu
Source: Journal of Physics: Conference Series; Nov2023, Vol. 2649 Issue 1, p1-10, 10p
-
4
Source: Insight: Non-Destructive Testing & Condition Monitoring; Mar2006, Vol. 48 Issue 3, p189-195, 7p
Subject Terms: NONDESTRUCTIVE testing, COMMERCIAL product testing, ULTRASONIC testing, TESTING
-
5
Authors:
Source: Automatic Control & Computer Sciences; Aug2008, Vol. 42 Issue 4, p169-174, 6p
-
6
Source: Communications of the ACM; Jul1982, Vol. 25 Issue 7, p487-492, 6p
Subject Terms: SEQUENTIAL machine theory, REDUCED instruction set computers, MICROELECTRONICS, INTEGRATED circuits
Reviews & Products: COMMUNICATIONS of the ACM (Periodical)
-
7
Authors:
Source: ACM Transactions on the Web; Apr2008, p14-14:36, 36p, 6 Diagrams, 2 Charts, 7 Graphs
Subject Terms: WEB services, COST effectiveness, DESIGN, RELIABILITY in engineering, APPLICATION software
-
8
Authors: et al.
Source: IEEE Transactions on Computers; 1980, Vol. C-29 Issue 2, p89-96, 8p
-
9
Authors: et al.
Source: IEEE Journal of Solid-State Circuits; 1980, Vol. 15 Issue 1, p25-32, 8p
-
10
Source: Insight: Non-Destructive Testing & Condition Monitoring; Aug2006, Vol. 48 Issue 8, p504-509, 6p
Subject Terms: PUBLICATIONS, NONDESTRUCTIVE testing, DYNAMICS, ESTIMATION theory, MATERIALS
-
11
Source: Insight: Non-Destructive Testing & Condition Monitoring; May2006, Vol. 48 Issue 5, p313-319, 7p
Subject Terms: BIBLIOGRAPHY, NONDESTRUCTIVE testing
-
12
Authors: Shih, L.
Source: 1990 Proceedings of the 23rd Annual Workshop & Symposium@m_MICRO 23: Microprogramming & Microarchitecture; 1990, p275-280, 6p
-
13
Authors: et al.
Source: Sensors (14248220); Feb2018, Vol. 18 Issue 2, p642, 15p, 1 Diagram, 1 Chart, 6 Graphs
Subject Terms: WASTEWATER treatment, BIOSENSORS, HEXAVALENT chromium, MICROBIAL fuel cells, CATHODES, SEDIMENT microbiology
-
14
-
15
Source: Proceedings of the IEEE; 1981, Vol. 69 Issue 9, p1177-1184, 8p
-
16
Source: IEEE Transactions on Computers; 1971, Vol. C-20 Issue 12, p1637-1637, 1p
-
17
Source: 2001 4th International Conference on ASIC Proceedings ASICON 2001 (Cat. No.01TH8549); 2001, pN.PAG, 1p
-
18
Source: IEEE Transactions on Computers; 1981, Vol. C-30 Issue 12, p1000-1000, 1p
-
19
Source: IEEE Transactions on Computers; 1973, Vol. C-22 Issue 12, p1144-1144, 1p
-
20
Nájsť tento článok vo Web of Science
Full Text Finder