Search Results - Control Structures and Microprogramming~Control Structure Reliability

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    Authors: Li, Junfu

    Source: Journal of Physics: Conference Series; Nov2023, Vol. 2649 Issue 1, p1-10, 10p

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    Source: Insight: Non-Destructive Testing & Condition Monitoring; Mar2006, Vol. 48 Issue 3, p189-195, 7p

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    Source: Insight: Non-Destructive Testing & Condition Monitoring; Aug2006, Vol. 48 Issue 8, p504-509, 6p

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    Source: Insight: Non-Destructive Testing & Condition Monitoring; May2006, Vol. 48 Issue 5, p313-319, 7p

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    Authors: Shih, L.

    Source: 1990 Proceedings of the 23rd Annual Workshop & Symposium@m_MICRO 23: Microprogramming & Microarchitecture; 1990, p275-280, 6p

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    Authors: Boehm, Barry W.

    Source: Software Engineering (9780470187562); 2007, p91-115, 25p

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    Source: Proceedings of the IEEE; 1981, Vol. 69 Issue 9, p1177-1184, 8p

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    Source: IEEE Transactions on Computers; 1971, Vol. C-20 Issue 12, p1637-1637, 1p

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    Source: 2001 4th International Conference on ASIC Proceedings ASICON 2001 (Cat. No.01TH8549); 2001, pN.PAG, 1p

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    Source: IEEE Transactions on Computers; 1981, Vol. C-30 Issue 12, p1000-1000, 1p

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    Source: IEEE Transactions on Computers; 1973, Vol. C-22 Issue 12, p1144-1144, 1p

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