Search Results - Algorithm-based verification
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Authors: et al.
Source: IEEE Transactions on Aerospace and Electronic Systems. 61:6202-6216
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Authors: et al.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 44:2367-2377
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Authors: et al.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 33:1765-1773
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Authors: et al.
Source: 2025 8th World Conference on Computing and Communication Technologies (WCCCT). :38-44
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Authors: et al.
Source: IEEE Transactions on Aerospace and Electronic Systems. :1-12
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Authors: et al.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 44:390-394
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Authors: et al.
Source: Nuclear Engineering and Technology, Vol 56, Iss 4, Pp 1330-1338 (2024)
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Authors: et al.
Source: CCF Transactions on High Performance Computing. 6:632-645
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Authors: et al.
Source: Proceedings of the 2024 10th International Conference on Communication and Information Processing. :668-674
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Authors:
Source: Computational Mathematics and Mathematical Physics. 64:2388-2398
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Authors: et al.
Source: IEEE Access, Vol 12, Pp 22144-22157 (2024)
Subject Terms: convolutional autoencoder-model verification, depth-wise separable convolution neural network, 0202 electrical engineering, electronic engineering, information engineering, deep learning, Online signature verification, Electrical engineering. Electronics. Nuclear engineering, 02 engineering and technology, TK1-9971
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Source: Yuanzineng kexue jishu, Vol 59, Iss 4, Pp 946-956 (2025)
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Authors: et al.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 43:2205-2214
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Authors: et al.
Source: 2024 36th Chinese Control and Decision Conference (CCDC). :4017-4021
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Source: 2024 7th World Conference on Computing and Communication Technologies (WCCCT). :86-91
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Authors: et al.
Source: Proceedings of the 2024 8th International Conference on Digital Signal Processing. :16-20
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Authors: et al.
Source: 2023 3rd International Conference on Robotics, Automation and Artificial Intelligence (RAAI). :156-161
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Authors: Wenwei Li
Source: Journal of Physics: Conference Series. 3065:012003
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Source: Soft Computing. 28:3353-3369
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