Suchergebnisse - (java OR (jana OR jan)) AND python source code*
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1
Autoren:
Quelle: Journal of King Saud University: Computer and Information Sciences, Vol 37, Iss 10, Pp 1-20 (2025)
Schlagwörter: Natural language processing, Code reuse detection, Function-level clone analysis, Java and python source code, Academic plagiarism detection, Electronic computers. Computer science, QA75.5-76.95
Relation: https://doi.org/10.1007/s44443-025-00362-2; https://doaj.org/toc/1319-1578; https://doaj.org/toc/2213-1248; https://doaj.org/article/0e8d85656442482785bc981b326c25a4
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2
Autoren: et al.
Weitere Verfasser: et al.
Schlagwörter: source code, merge, tool, software engineering
Zugangs-URL: http://hdl.handle.net/11375/28838
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3
Autoren: et al.
Quelle: IEEE Access. 13:54561-54584
Schlagwörter: Codes, Accuracy, Vocabulary, Java, Feature extraction, Python, Training, Reproducibility of results, Random forests, Programming, Flaky tests, non-deterministic tests, machine learning, artificial intelligence, software testing
Dateibeschreibung: electronic
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4
Autoren:
Quelle: Computer Science and Information Technology Trends. :215-229
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5
Autoren:
Quelle: Applied Computer Systems, Vol 30, Iss 1, Pp 105-121 (2025)
Schlagwörter: artificial intelligence, chatgpt4.1, c++, deep learning, deepseek r1, java, machine learning, nmt, object oriented, programming languages translation, python, source code translation, smt, Computer software, QA76.75-76.765
Dateibeschreibung: electronic resource
Relation: https://doaj.org/toc/2255-8691
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6
Autoren: et al.
Quelle: IET Software (Wiley-Blackwell). 1/16/2026, Vol. 2026, p1-25. 25p.
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7
Autoren: et al.
Quelle: Procedia Computer Science. 2025, Vol. 269, p1171-1180. 10p.
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8
Autoren:
Quelle: Journal of Applied Informatics and Computing, Vol 9, Iss 6, Pp 3079-3086 (2025)
Schlagwörter: code plagiarism, codebert, siamese network, deep learning, source code plagiarism, identification, Electronic computers. Computer science, QA75.5-76.95
Dateibeschreibung: electronic resource
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9
Autoren: et al.
Quelle: Information & Software Technology. Nov2025, Vol. 187, pN.PAG-N.PAG. 1p.
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10
Autoren:
Quelle: IEEE Transactions on Pattern Analysis & Machine Intelligence; Nov2022, Vol. 44 Issue 11, p8420-8432, 13p
Schlagwörter: SOURCE code, C++, PYTHON programming language, DECISION making, ALGORITHMS
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11
Autoren: et al.
Quelle: Frontiers in Neuroinformatics; 2025, p1-15, 15p
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12
Autoren: et al.
Quelle: Pattern Recognition Letters. Jan2026, Vol. 199, p295-302. 8p.
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13
Autoren: Herka, Iwo
Quelle: Advances in Cognitive Psychology; 2025, Vol. 21 Issue 4, p445-461, 17p
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14
Autoren: Insanudin, E
Quelle: Journal of Physics: Conference Series ; volume 1280, issue 3, page 032027 ; ISSN 1742-6588 1742-6596
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15
Autoren: et al.
Quelle: Frontiers in Neuroinformatics; 2025, p1-21, 21p
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16
Autoren:
Quelle: Independent Journal of Teaching & Learning; 2024, Vol. 19 Issue 1, p79-92, 14p
Schlagwörter: PLAGIARISM, STUDENTS, COVID-19 pandemic, PYTHON programming language, AWARENESS
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17
Autoren: et al.
Quelle: Analytics, Vol 3, Iss 1, Pp 46-62 (2024)
Schlagwörter: Java programming learning, JPLAS, JUnit, code writing problem, plagiarism, Levenshtein distance, Electronic computers. Computer science, QA75.5-76.95, Probabilities. Mathematical statistics, QA273-280
Dateibeschreibung: electronic resource
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18
Autoren: Frantz, Miles Eugene
Thesis Advisors: Computer Science and#38; Applications, Yao, Danfeng, Rajagopalan, Raj, Meng, Na, Chung, Taejoong Tijay, Brown, Dwayne Christian
Schlagwörter: Large Language Models, Machine Learning, Static Code Analysis, Python, Java, Benchmark
Dateibeschreibung: ETD; application/pdf
Verfügbarkeit: https://hdl.handle.net/10919/121100
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19
Autoren: et al.
Quelle: Engineering Optimization; May2025, Vol. 57 Issue 5, p1198-1218, 21p
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20
Autoren: et al.
Quelle: IEEE Access, Vol 13, Pp 192263-192293 (2025)
Schlagwörter: Large language model, systematic literature review, vulnerability detection, vulnerability repair, vulnerability explanation, vulnerability reasoning, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
Dateibeschreibung: electronic resource
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