Search Results - "parallel program testing"
-
1
Authors: et al.
Source: The Journal of Supercomputing. 80:519-548
-
2
Authors: et al.
Source: Journal of Supercomputing; Jan2024, Vol. 80 Issue 1, p519-548, 30p
-
3
Authors:
Source: Tongxin xuebao, Pp 178-183 (2006)
Subject Terms: parallel program testing, grid computing, reachability, race condition, racevariants, Telecommunication, TK5101-6720
File Description: electronic resource
-
4
Authors:
Contributors:
Source: ftp://ftp.cpc.wmin.ac.uk/pub/sepp/P5/appendix-E1.ps.gz
Subject Terms: parallel program testing, test design, testing scenario, operational behavior simulation
File Description: application/postscript
-
5
Authors:
Source: Tongxin xuebao, Pp 178-183 (2006)
Subject Terms: race condition, parallel program testing, Telecommunication, racevariants, TK5101-6720, grid computing, reachability
-
6
Authors:
Source: Eng (2673-4117); Mar2025, Vol. 6 Issue 3, p48, 20p
-
7
Authors:
Source: World Journal of Engineering and Technology. :273-280
Subject Terms: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
-
8
Source: Programming Multi-core & Many-core Computing Systems; 2017, p321-342, 21p
-
9
-
10
Authors:
Source: Automated Software Engineering; Sep2016, Vol. 23 Issue 3, p469-500, 32p
-
11
Authors:
Source: 2012 IEEE Sixth International Conference on Software Security & Reliability Companion; 1/ 1/2012, p18-23, 6p
-
12
Authors: Andrew H. Sung
Source: Proceedings., 2nd Symposium on the Frontiers of Massively Parallel Computation. :559-566
Subject Terms: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
-
13
Authors: et al.
Source: Proceedings 1996 Asia-Pacific Software Engineering Conference; 1996, p336-344, 9p
-
14
Authors: Zhiwei Xu
Source: Sixth Distributed Memory Computing Conference, 1991 Proceedings; 1991, p214-217, 4p
-
15
Authors: et al.
Source: Proceedings of ISSRE '96: 7th International Symposium on Software Reliability Engineering; 1996, p122-130, 9p
-
16
Authors: et al.
Source: Concurrency & Computation: Practice & Experience; Nov2008, Vol. 20 Issue 16, p1893-1916, 24p, 4 Diagrams, 12 Charts
-
17
Authors:
Source: Proceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis. :153-162
Subject Terms: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
-
18
Authors: et al.
Contributors: et al.
Subject Terms: parallel programming, testing tool, all-du-path coverage
File Description: application/postscript
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.29.9876; http://www.eecis.udel.edu/~pollock/papers/issta98.ps
-
19
Authors:
Source: ACM SIGSOFT Software Engineering Notes ; volume 23, issue 2, page 153-162 ; ISSN 0163-5948
-
20
Authors:
Contributors:
Subject Terms: Without wavelet Transformation
File Description: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.386.4187; http://people.cis.ksu.edu/~hadassa/documents_pdf/phase3/TestAssesement.pdf
Full Text Finder
Nájsť tento článok vo Web of Science