Search Results - "field plates (FPs)"

Cryogenic Trapping Effects in GaN-HEMTs: Influences of Fe-Doped Buffer and Field Plates

Authors: Mebarki, Mohamed Aniss Castillo, Ragnar Ferrand-Drake Del Meledin, Denis et al.

Source: IEEE Transactions on Electron Devices. 72(8):4042-4048

Subject Terms: Logic gates, MODFETs, HEMTs, Pulse measurements, Iron, Cryogenics, Current measurement, Electron traps, Lighting, Performance evaluation, Cryogenic, field plates (FPs), GaN high electron mobility transistors (HEMTs), iron (Fe), traps

File Description: electronic

Access URL: https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-216797
https://doi.org/10.1109/TED.2025.3581541