Suchergebnisse - "atomic force microscopy"

Investigation of dynamics of the microcantilever in torsional resonance atomic force microscopy in liquid environments.

Autoren: Yang, Changyun Zhou, Xilong Zhang, Bangzhi

Quelle: Journal of Applied Physics. 11/14/2025, Vol. 138 Issue 18, p1-11. 11p.

Schlagwörter: *MICROCANTILEVERS, *ATOMIC force microscopy, *SURFACE topography, *FLUID-structure interaction, *MODULUS of rigidity

Advances in unveiling water's molecular mysteries.

Autoren: Goy, Claudia Kimmel, Gregory Jiang, Ying et al.

Quelle: Journal of Chemical Physics. 9/21/2025, Vol. 163 Issue 11, p1-9. 9p.

Schlagwörter: *MOLECULAR structure of water, *ATOMIC force microscopy, *PHASE transitions

Revisiting crosslinking density effects on pNIPAM microgel properties: Size, electrophoretic mobility, and transition temperatures.

Autoren: KS, Syamjith Rout, Shubhasmita Jacob, Alan R.

Quelle: Journal of Chemical Physics. 5/14/2025, Vol. 162 Issue 18, p1-16. 16p.

Schlagwörter: *PHASE transitions, *ATOMIC force microscopy, *POLY(ISOPROPYLACRYLAMIDE), *TRANSITION temperature, *MICROGELS

Adsorption and reaction of 2-methylbenzimidazole molecules on a partially oxidized Cu(110) surface.

Autoren: Zhou, Minlu Lu, Xinle Sun, Rong et al.

Quelle: Journal of Chemical Physics. 5/7/2025, Vol. 162 Issue 17, p1-7. 7p.

Schlagwörter: *SCANNING tunneling microscopy, *ATOMIC force microscopy, *METALLIC surfaces, *ADATOMS, *SCISSION (Chemistry), *COPPER, *COPPER surfaces

An atomically resolved study of droplet epitaxy InAs quantum dots grown on InGa(As,P)/InP by MOVPE for quantum photonic applications.

Autoren: Banfi, E. G. Sala, E. M. Gajjela, R. S. R. et al.

Quelle: Journal of Applied Physics. 4/7/2025, Vol. 137 Issue 13, p1-12. 12p.

Schlagwörter: *SCANNING tunneling microscopy, *ATOMIC force microscopy, *LATTICE constants, *INDIUM gallium arsenide, *MODULATION (Music theory)

Full-field strain measurements at the nanoscale.

Autoren: Chasiotis, Ioannis Lee, Sunho

Quelle: Journal of Intelligent Material Systems & Structures. Nov2025, Vol. 36 Issue 18/19, p1285-1289. 5p.

Schlagwörter: ATOMIC force microscopy, STRAINS & stresses (Mechanics), DIGITAL image correlation, MATERIALS testing, NANOMECHANICS, HIGH resolution imaging, MICROSTRUCTURE, VISCOELASTIC materials

Low-temperature AFM with a microwave cavity optomechanical transducer

Autoren: Scarano, Ermes Arvidsson, Elisabet Roos, August K. et al.

Quelle: Beilstein Journal of Nanotechnology. 16:1873-1882

Schlagwörter: atomic force microscopy, cavity optomechanics

Dateibeschreibung: print

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-372572
https://doi.org/10.3762/bjnano.16.130

Label-free and real-time synchronized monitoring of extracellular matrix proteolysis using quartz crystal microbalance and nanoplasmonic sensing with morphological validation by atomic force microscopy

Autoren: Szczepanczyk, Michal Gonzalez-Martinez, Juan F Ruzgas, Tautgirdas et al.

Quelle: Journal of Colloid and Interface Science. 703

Schlagwörter: Atomic force microscopy, Collagen, Collagenase, Elastase, Elastin, Extracellular matrix, Localized surface plasmon resonance, Proteases, Quartz crystal microbalance

Dateibeschreibung: electronic

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:mau:diva-80014
https://doi.org/10.1016/j.jcis.2025.139139

Nanoscopic structural and optical investigations on blue InGaN single quantum wells serving as layers beneath efficient red active layers.

Autoren: Zhang, Zhaozong Ishii, Ryota Shojiki, Kanako et al.

Quelle: Journal of Applied Physics. 2/7/2025, Vol. 137 Issue 5, p1-8. 8p.

Schlagwörter: *NEAR-field microscopy, *ATOMIC force microscopy, *INDIUM gallium nitride, *X-ray diffraction measurement, *QUANTUM wells

Structural and optical properties of cubic GaN films on high-thermal conductivity substrates.

Autoren: Freitas Jr., Jaime A. Culbertson, James C. Storm, David F. et al.

Quelle: Journal of Applied Physics. 1/21/2025, Vol. 137 Issue 3, p1-9. 9p.

Schlagwörter: *ATOMIC force microscopy, *SUBSTRATES (Materials science), *X-ray diffraction measurement, *RAMAN microscopy, *RAMAN scattering

Improving the Reliability of Conductive Atomic Force Microscopy

Autoren: Weber, Jonas

Weitere Verfasser: University/Department: Universitat de Barcelona. Facultat de Física

Thesis Advisors: Lanza, Mario, Fernández Pradas, Juan Marcos

Quelle: TDX (Tesis Doctorals en Xarxa)

Schlagwörter: Microscòpia de força atòmica, Microscopía de fuerza atómica, Atomic force microscopy, Ciències Experimentals i Matemàtiques

Dateibeschreibung: application/pdf

Zugangs-URL: http://hdl.handle.net/10803/690847

Sub-ablation-threshold light-induced modification of thin ruthenium layers detected using optical reflectance.

Autoren: Abram, Ester Orlov, Nikolai Garnett, Erik C. et al.

Quelle: Journal of Applied Physics. 12/28/2024, Vol. 136 Issue 24, p1-14. 14p.

Schlagwörter: *ATOMIC force microscopy, *ALUMINUM forming, *FEMTOSECOND pulses, *LIGHT sources, *SEMICONDUCTOR devices

A bi-channel aided stitching of atomic force microscopy images.

Autoren: Zhao, Huanhuan Millan-Solsona, Ruben Checa, Marti et al.

Quelle: Scientific Reports. 11/25/2025, Vol. 15 Issue 1, p1-13. 13p.

Schlagwörter: *ATOMIC force microscopy, *MICROSCOPY, *IMAGE registration, *IMAGE processing, *MORPHOLOGY

Controlled Activation of Reactive Oxygen Species by Atomic Force Microscopy: Synthesis of Superoxo and Ozone Molecules on Rutile TiO2 (110) Surface.

Autoren: Adachi, Yuuki Wen, Huan Fei Sugawara, Yasuhiro et al.

Quelle: ChemCatChem. Nov2025, p1. 11p. 7 Illustrations.

Schlagwörter: *REACTIVE oxygen species, *ATOMIC force microscopy, *DENSITY functional theory, *PHOTOCATALYSIS, *OZONE generators, *TITANIUM dioxide, *EXCITON theory

Dual‐Functional 3D‐Nanoprinted AFM Probes for Correlative Magnetic and Conductive Characterization.

Autoren: Seewald, Lukas M. Winkler, Robert Kothleitner, Gerald et al.

Quelle: Small Methods. Nov2025, p1. 12p. 7 Illustrations.

Schlagwörter: *MAGNETIC force microscopy, *ATOMIC force microscopy, *NANOFABRICATION, *NANOTECHNOLOGY

Nanoscale Wetting and Mechanical Characterization of Peptide Coacervates on Supported Lipid Bilayers by Atomic Force Microscopy.

Autoren: Viana Ferreira, Filipe Gudlur, Sushanth Miserez, Ali

Quelle: Small Methods. Nov2025, p1. 13p. 7 Illustrations.

Schlagwörter: *WETTING, *ATOMIC force microscopy, *BILAYER lipid membranes, *CELL adhesion, *VISCOELASTICITY, *DRUG delivery systems, *PEPTIDES, *NANOSCIENCE

Efficient polarity recognition in p-type 4H-SiC single crystals using pull-off force signatures.

Autoren: Sui, Zhanren Wang, Weiyi Huang, Yuanchao et al.

Quelle: CrystEngComm. 11/14/2025, Vol. 27 Issue 42, p6949-6955. 7p.

Schlagwörter: *SILICON carbide, *ATOMIC force microscopy, *POLARITY (Chemistry), *INSULATED gate bipolar transistors, *P-type semiconductors, *NONDESTRUCTIVE testing, *SURFACE forces, *SURFACE properties

Atomic Force Microscopy for Cross‐Disciplinary Materials Research.

Autoren: Joo, Soyun Eom, Seongmun Choi, Youngwoo et al.

Quelle: Small Methods. Nov2025, Vol. 9 Issue 11, p1-44. 44p.

Schlagwörter: *ATOMIC force microscopy, *MATERIALS science, *COOPERATIVE research, *SURFACE properties, *RESEARCH protocols, *DATA quality, *NANOSCIENCE, *EMPIRICAL research

Transfer Learning‐Empowered High‐Throughput Atomic Force Microscopy Structural Analysis of DNA Nanostructures.

Autoren: Dai, Zheze Chen, Xiaoliang Hao, Yaya et al.

Quelle: Small Structures. Nov2025, Vol. 6 Issue 11, p1-8. 8p.

Schlagwörter: *ATOMIC force microscopy, *DNA nanotechnology, *KNOWLEDGE transfer, *MORPHOLOGY, *ARTIFICIAL neural networks, *ALGORITHMS

Dynamic change in light-regulated hardness in SrTiO3.

Autoren: Nammahachak, Nant Sriondee, Manlika Eknapakul, Tanachat et al.

Quelle: Applied Physics Letters. 10/23/2025, Vol. 127 Issue 17, p1-7. 7p.

Schlagwörter: *SINGLE crystals, *ATOMIC force microscopy, *HARDNESS, *ANISOTROPY, *METALLIC oxides