Suchergebnisse - "XPS"
-
1
Autoren: et al.
Quelle: ACS Applied Materials and Interfaces. 17(3):5153-5164
Schlagwörter: organic semiconductors, work function shifts, Kelvin probe, near-ambient pressure XPS, ambientair, doping
Dateibeschreibung: electronic
-
2
Autoren: et al.
Quelle: Applied Catalysis B. 381
Schlagwörter: AP-XPS, DFT, Magnetron Sputtering, Methanol, Ni5Ga3, Thin Films
Dateibeschreibung: print
-
3
Autoren: et al.
Quelle: Materials & design. 257
Schlagwörter: Boron film, Low-temperature growth, Magnetron sputtering, Nanostructure, XPS, Mechanical properties
Dateibeschreibung: electronic
-
4
Autoren: Greczynski, Grzegorz
Quelle: Applied Surface Science. 709
Schlagwörter: XPS, Insulators, Charging, Thin films, Silica, Photoelectron spectroscopy
Dateibeschreibung: electronic
-
5
Autoren: et al.
Quelle: Applied Surface Science. 686
Schlagwörter: Diboride thin films, High-temperature oxidation, Mechanical properties, HiPIMS, XPS, Nanostructure
Dateibeschreibung: electronic
-
6
Autoren: et al.
Quelle: Journal of the American Chemical Society. 146(40):27886-27902
Schlagwörter: XPS, design rules, NEXAFS, in situ, operando, stability, electrochemistry, nanosheets, polymer electrolyte membrane (PEM), electronic structure, oxygen evolution reaction (OER), Iridium oxide
Dateibeschreibung: electronic
-
7
Autoren: et al.
Quelle: Journal of Manufacturing Technology Management. 36(9):69-87
Schlagwörter: Corporate lean management, Implementation, Improvement programme, Production, XPS
Dateibeschreibung: electronic
-
8
Autoren: et al.
Quelle: ACS Applied Materials and Interfaces. 16(28):37275-37287
Schlagwörter: AFM, GISAXS, photocatalytic oxidation, SARS-CoV-2 virus-like particles (VLPs), titanium dioxide, XPS
Dateibeschreibung: print
-
9
Autoren:
Quelle: Journal of Industrial Engineering and Management. 17(2):385-402
Schlagwörter: case study, grounded theory, knowledge management, lean management, level of standardization, multinational companies, XPS
Dateibeschreibung: print
-
10
Autoren: et al.
Quelle: StandUp ACS Applied Energy Materials. 8(1):461-472
Schlagwörter: thin film solar cells, ACIGSe, alkali-PDT, AP-XPS, HfO
x , ALDDateibeschreibung: electronic
-
11
Autoren: et al.
Quelle: StandUp ACS Applied Materials and Interfaces. 16(30):40210-40221
Schlagwörter: BaZrS3, chalcogenideperovskites, XPS, HAXPES, electronic structure, DFT
Dateibeschreibung: electronic
-
12
Autoren: et al.
Quelle: Mining, Metallurgy & Exploration. 41:1013-1023
Schlagwörter: Pyrite, Hydrothermal, Minerals, Hematite, x-ray, diffraction, EDX, XPS
Dateibeschreibung: electronic
-
13
Autoren: Cerra Flórez, Mauro Andrés
Weitere Verfasser: University/Department: Universitat Politècnica de Catalunya. Departament de Ciència i Enginyeria de Materials
Thesis Advisors: da Silva, Marcelo José Gomes, Fargas Ribas, Gemma
Quelle: TDX (Tesis Doctorals en Xarxa)
Schlagwörter: Maraging steels, Heat treatments, Oxidation, Oxide film, Spinel ferrites, XRD study, Raman study, XPS study, Nanoscratch study, Acero maraging, Àrees temàtiques de la UPC::Enginyeria dels materials
Dateibeschreibung: application/pdf
-
14
Autoren:
Quelle: Journal of Physics: Condensed Matter. 37(14)
Schlagwörter: 40 Engineering (for-2020), 4009 Electronics, Sensors and Digital Hardware (for-2020), 51 Physical Sciences (for-2020), 5104 Condensed Matter Physics (for-2020), tin telluride, topological crystalline insulator, Fermi level, defect engineering, work function, x-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), Fermi level, defect engineering, tin telluride, topological crystalline insulator, ultraviolet photoelectron spectroscopy (UPS), work function, x-ray photoelectron spectroscopy (XPS), 0204 Condensed Matter Physics (for), 0912 Materials Engineering (for), 1007 Nanotechnology (for), Fluids & Plasmas (science-metrix), 4016 Materials engineering (for-2020), 4018 Nanotechnology (for-2020), 5104 Condensed matter physics (for-2020)
Dateibeschreibung: application/pdf
-
15
Autoren: et al.
Weitere Verfasser: et al.
Quelle: ACS Applied Materials & Interfaces. 17:48195-48208
Schlagwörter: XPS analysis, [CHIM] Chemical Sciences, electrochemical performance, oxy-sulfide solid electrolytes, Solid-state batteries, EIS analysis
Dateibeschreibung: application/pdf
-
16
Autoren: et al.
Quelle: Ingenius: Revista de Ciencia y Tecnología, Iss 34 (2025)
Schlagwörter: Technology, Q1-390, functional groups, Science (General), synthesis, FTIR, SEM, XPS, Graphene oxide
-
17
Autoren: et al.
Quelle: Beilstein J Nanotechnol
Beilstein Journal of Nanotechnology, Vol 16, Iss 1, Pp 847-859 (2025) -
18
Autoren: et al.
Weitere Verfasser: et al.
Quelle: The Journal of Physical Chemistry C. 129:16164-16175
Schlagwörter: HAp Ruthenium Integrated molar absorption coefficient Catalyst TEM XRF XPS, XRF, [CHIM] Chemical Sciences, XPS, TEM, Catalyst, HAp, Integrated molar absorption coefficient, Ruthenium
Dateibeschreibung: application/pdf
-
19
Autoren: et al.
Quelle: Nano Letters. 25(22)
Schlagwörter: Engineering, Physical Sciences, Condensed Matter Physics, Affordable and Clean Energy, Thermoelectrics, Sb2Te3, 2D nanoplates, XPS, HRTEM, Seebeck coefficient, Nanoscience & Nanotechnology
Dateibeschreibung: application/pdf
-
20
Autoren: et al.
Quelle: Surface and Interface Analysis. 55(1):26-40
Schlagwörter: adsorption, ESCA, glass, mica, polyelectrolyte, quantification, silica, surface conditioning, XPS, Ionic strength, Polyelectrolytes, Substrates, X ray photoelectron spectroscopy, Adsorbed amount, Adsorption layer, Low ionic strength, Polyelectrolyte adsorption, Silanol groups, Silica surface, Surface and interface analysis
Dateibeschreibung: print
Nájsť tento článok vo Web of Science
Full Text Finder