Suchergebnisse - "X-ray reflectivity"

Formation and Evolution of the Solid Electrolyte Interphase on Silicon Electrodes from Fluorine-Free Electrolytes

Autoren: Lu, Zijie Patranika, Tamara Naylor, Andrew J. et al.

Quelle: StandUp Small. 21(9)

Schlagwörter: fluorine-free electrolyte, lithium-ion battery, Operando X-ray reflectivity, silicon electrode, solid electrolyte interphase, X-ray photoelectron spectroscopy

Dateibeschreibung: electronic

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-556779
https://doi.org/10.1002/smll.202410654

Morphology of Buried Interfaces in Ion-Assisted Magnetron Sputter-Deposited 11B4C-Containing Ni/Ti Multilayer Neutron Optics Investigated by Grazing-Incidence Small-Angle Scattering

Autoren: Stendahl, Sjoerd Ghafoor, Naureen Schwartzkopf, Matthias et al.

Quelle: ACS Applied Materials and Interfaces. 16(17):22665-22675

Schlagwörter: neutron optics, Ni/Ti, multilayer, ion-assisted magnetron sputter deposition, grazing-incidencesmall-angle X-ray scattering, GISAXS, interfacemorphology, neutron reflectivity, X-ray reflectivity

Dateibeschreibung: electronic

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-205185
https://liu.diva-portal.org/smash/get/diva2:1875868/FULLTEXT01.pdf

Phase Transformations in Evaporated Ph‐BTBT‐10 Thin Films and Impact on the Device Performance

Autoren: Lamiaa Fijahi Shunya Yan Ann Maria James et al.

Quelle: Advanced Materials Interfaces, Vol 12, Iss 19, Pp n/a-n/a (2025)

Schlagwörter: Kelvin probe force microscopy, OFET, organic semiconductor, Ph‐BTBT‐10, polymorphism, X‐ray reflectivity, Physics, QC1-999, Technology

Dateibeschreibung: electronic resource

Relation: https://doaj.org/toc/2196-7350

Zugangs-URL: https://doaj.org/article/400bc072c9f648c3a58048bdd3a7aa07

Probing Surface Dynamics of SiOx Thin-Film Electrodes during Cycling through X-Ray Photoemission Spectroscopy and Operando X-Ray Reflectivity

Autoren: Zijie Lu Khawla Zrikem Frédéric Le Cras et al.

Weitere Verfasser: Zijie Lu Khawla Zrikem Frédéric Le Cras et al.

Quelle: ACS Applied Materials & Interfaces. 16:52130-52143

Schlagwörter: Lithium-ion batteries, Solid electrolyte interphase (SEI), Operando synchrotron X-ray reflectivity (XRR), [CHIM] Chemical Sciences, [CHIM]Chemical Sciences, X-ray photoelectron spectroscopy (XPS), [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], SiOx thin-film electrodes, [PHYS.COND] Physics [physics]/Condensed Matter [cond-mat], Surface dynamics

Dateibeschreibung: application/pdf

Zugangs-URL: https://pubmed.ncbi.nlm.nih.gov/39298291
https://cea.hal.science/cea-04708493v1/document
https://cea.hal.science/cea-04708493v1
https://doi.org/10.1021/acsami.4c05078

Research progress on the structure of hydration films at solid–liquid interfaces

Autoren: Na ZHANG Jue KOU Chunbao SUN

Quelle: 工程科学学报, Vol 47, Iss 3, Pp 401-410 (2025)

Schlagwörter: hydration films, x-ray reflectivity, atomic force microscopy, mica, calcite, Mining engineering. Metallurgy, TN1-997, Environmental engineering, TA170-171

Dateibeschreibung: electronic resource

Relation: https://doaj.org/toc/2095-9389

Zugangs-URL: https://doaj.org/article/c962fc94cd9b4ab88e5da306041f068d

Physical Properties of New Silica-Based Denture Surface Coating

Autoren: Kazuhiro Akutsu-Suyama Reiko Tokuyama-Toda Chiaki Tsutsumi-Arai et al.

Quelle: Nanomaterials, Vol 15, Iss 21, p 1652 (2025)

Schlagwörter: denture bases, Candida albicans, antifungal agents, biomaterials, X-ray reflectivity techniques, neutron reflectivity techniques, Chemistry, QD1-999

Dateibeschreibung: electronic resource

Relation: https://www.mdpi.com/2079-4991/15/21/1652; https://doaj.org/toc/2079-4991

Zugangs-URL: https://doaj.org/article/0631f70a954244408ebd3d5ef912918b

Revealing the Origin and Nature of the Buried Metal‐Substrate Interface Layer in Ta/Sapphire Superconducting Films

Autoren: Aswin k. Anbalagan Rebecca Cummings Chenyu Zhou et al.

Quelle: Adv Sci (Weinh)
Advanced Science, Vol 12, Iss 17, Pp n/a-n/a (2025)

Schlagwörter: superconducting films, Superconductivity (cond-mat.supr-con), Condensed Matter - Materials Science, tantalum, Science, Condensed Matter - Superconductivity, synchrotron X‐ray reflectivity, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, HAADF‐STEM, density functional theory modeling, Research Article

Zugangs-URL: https://pubmed.ncbi.nlm.nih.gov/39968930
http://arxiv.org/abs/2409.10780
https://doaj.org/article/1ce16343731b47aa90c80d4b34c1e1ca

X-ray standing wave characterization of the strong metal–support interaction in Co/TiO x model catalysts

Autoren: Atul Tiwari Matteo Monai Ksenia Matveevskii et al.

Weitere Verfasser: Atul Tiwari Matteo Monai Ksenia Matveevskii et al.

Quelle: J Appl Crystallogr

Schlagwörter: SMSI, grazing incidence X-ray fluorescence, multilayers, General Biochemistry,Genetics and Molecular Biology, supported metal catalysts, X-ray standing waves, X-ray reflectivity, XRR, Research Papers, 7. Clean energy, strong metal–support interactions, 13. Climate action, XSW, GIXRF

Dateibeschreibung: application/pdf

Zugangs-URL: https://pubmed.ncbi.nlm.nih.gov/38596732
https://dspace.library.uu.nl/handle/1874/438356

Thickness and composition of native oxides and near-surface regions of Ni superalloys

Autoren: Larsson, Alfred D'Acunto, Giulio Vorobyova, Mariya et al.

Quelle: Journal of Alloys and Compounds. 895

Schlagwörter: XPS, X-ray photoelectron spectroscopy, XRR, X-ray reflectivity, Synchrotron, Nickel alloy, Ni, Cr, Mo, Fe, Nb, Superalloy, Oxide, Passive film, Native oxide, Corrosion

Dateibeschreibung: print

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-305628
https://doi.org/10.1016/j.jallcom.2021.162657

Combined x‐ray reflectivity and grazing incidence x‐ray fluorescence study of Ta/Cr/Pt thin film stacks

Autoren: Philippe Jonnard Karine Le Guen Renaud Delaunay et al.

Weitere Verfasser: Philippe Jonnard Karine Le Guen Renaud Delaunay et al.

Quelle: X-Ray Spectrometry. 52:437-446

Schlagwörter: instrumentation, magnetron sputtering, X-ray reflectivity (XRR), x‐ray waveguide, 02 engineering and technology, 7. Clean energy, 01 natural sciences, [PHYS] Physics [physics], 0104 chemical sciences, Grazing incidence x-ray fluorescence (GIXRF), metrology, radioactivity, X-rays, Waveguide, Thin film, quality control, x‐ray beam, ionizing radiation, 0210 nano-technology, nuclear instrumentation

Dateibeschreibung: application/pdf

Zugangs-URL: https://hal.science/hal-04244005v1
https://hal.science/hal-04244005v1/document
https://doi.org/10.1002/xrs.3382

A step toward calculating the uncertainties in combined GIXRF‐XRR

Autoren: Stephanie Melhem Yves Ménesguen Emmanuel Nolot et al.

Weitere Verfasser: Stephanie Melhem Yves Ménesguen Emmanuel Nolot et al.

Quelle: X-Ray Spectrometry. 52:412-422

Schlagwörter: thin film, grazing incidence X-ray fluorescence, X-ray reflectivity, modelling, chalcogenide, Bootstrap statistical method, particle transport, multilayered material, signal processing, Monte Carlo, material characterisation, roughness, dynamic range, density, detector, uncertaintiy assessment, carbon caping layer, simulation, thickness, measuring procedures, metrology, elemental composition, [PHYS.PHYS.PHYS-INS-DET] Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], associated uncertainties, ionizing radiation, [PHYS.COND] Physics [physics]/Condensed Matter [cond-mat], data analysis procedures

Dateibeschreibung: application/pdf

Zugangs-URL: https://cea.hal.science/cea-04563756v1/document
https://cea.hal.science/cea-04563756v1
https://doi.org/10.1002/xrs.3377

Insights into Chemical Interactions and Related Toxicities of Deep Eutectic Solvents with Mammalian Cells Observed Using Synchrotron Macro–ATR–FTIR Microspectroscopy

Autoren: Saffron J. Bryant Z. L. Shaw Louisa Z. Y. Huang et al.

Quelle: Biophysica, Vol 3, Iss 2, Pp 318-334 (2023)
Biophysica; Volume 3; Issue 2; Pages: 318-334

Schlagwörter: ionic liquids, deep eutectic solvents, cryoprotectants, ATR–FTIR, cell toxicity, X-ray reflectivity, neutron reflectivity, QH301-705.5, Biology (General)

Dateibeschreibung: application/pdf

Zugangs-URL: https://doaj.org/article/13f4dba676af4104b7fa26c2488e98ba

Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser

Autoren: Engel, Robin Y. Miedema, Piter S. Turenne, Diego et al.

Quelle: Applied Sciences. 10(19)

Schlagwörter: X-ray absorption spectroscopy, free electron laser, intensity normalization, transmission grating, X-ray reflectivity

Dateibeschreibung: electronic

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-426363
https://doi.org/10.3390/app10196947

Sample cell for studying liquid interfaces with an in situ electric field using X-ray reflectivity and application to clay particles at oil–oil interfaces

Autoren: Larsen, Simon R. Hansteen, Marie Pacakova, Barbara et al.

Quelle: Journal of Synchrotron Radiation. 25(Part: 3):915-917

Schlagwörter: X ray reflectivity, electrical field, liquid surface, oil-oil interface, clay

Dateibeschreibung: electronic

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-356086
https://doi.org/10.1107/S1600577518004848

Ion correlations drive charge overscreening and heterogeneous nucleation at solid–aqueous electrolyte interfaces

Autoren: Lee, Sang Soo Koishi, Ayumi Bourg, Ian C et al.

Quelle: Proceedings of the National Academy of Sciences of the United States of America. 118(32)

Schlagwörter: Physical Sciences, Condensed Matter Physics, EDL, adsorption, salinity, X-ray reflectivity, molecular dynamics

Dateibeschreibung: application/pdf

Zugangs-URL: https://escholarship.org/uc/item/4073t62z
https://escholarship.org/content/qt4073t62z/qt4073t62z.pdf

Nanomechanical and structural study of Au38 nanocluster Langmuir-Blodgett films using bimodal atomic force microscopy and X-ray reflectivity

Autoren: Swierczewski, Michal Chenneviere, Alexis Lee, Lay-Theng et al.

Weitere Verfasser: Swierczewski, Michal Chenneviere, Alexis Lee, Lay-Theng et al.

Quelle: Journal of Colloid and Interface Science. 630:28-36

Schlagwörter: Langmuir-Blodgett (LB), [CHIM.MATE] Chemical Sciences/Material chemistry, X-Rays, Metal Nanoparticles, X-ray reflectivity, 02 engineering and technology, Microscopy, Atomic Force, 01 natural sciences, gold nanocluster, bimodal atomic force microscopy (AFM), Elastic Modulus, Young's modulus, Gold, nanomechanical mapping, 0204 chemical engineering, 0210 nano-technology, 0105 earth and related environmental sciences

Dateibeschreibung: application/pdf

Zugangs-URL: https://pubmed.ncbi.nlm.nih.gov/36327730

Optical Constants and Thickness Determination of La2/3sr1/3mno3 Thin Films on Nb:Srtio3 Substrates by Spectro-Ellipsometry: Combination of Optical and X-Ray Techniques

Autoren: Blond, Jérémy Dufour, Christian Chaluvadi, Sandeep Kumar et al.

Weitere Verfasser: Blond, Jérémy Dufour, Christian Chaluvadi, Sandeep Kumar et al.

Schlagwörter: [PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [CHIM.MATE] Chemical Sciences/Material chemistry, [SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic, [SPI.ELEC] Engineering Sciences [physics]/Electromagnetism, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS.PHYS.PHYS-COMP-PH] Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], [CHIM.MATE]Chemical Sciences/Material chemistry, [SPI.MAT] Engineering Sciences [physics]/Materials, [PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], [SPI.MAT]Engineering Sciences [physics]/Materials, [PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 40 nm thick La Sr MnO3 (LSMO) thin films were epitaxially grown by Pulsed Laser Deposition (PLD) onto niobium doped SrTiO3 (Nb:STO) substrates, with different Nb concentration from 0.01%wt to 0.5%wt. The optical characterization of the heterostructures by spectroscopic ellipsometry enables us to extract the optical constants of the manganite heteroepitaxial layer at room temperature. Performing spectrophotometry in the same wavelength range brings a useful cross-validation of the extracted results. In addition, the thickness evaluation of the LSMO layer by spectro-ellipsometry is further validated by both High Resolution X-ray diffraction and X-ray reflectivity, as well as a Transmission Electron Microscopy cross section, taken as a physical reference. This study validates quantitatively the spectro-ellipsometry as a suitable routine tool to measure accurately both thickness and complex refractive index of the LSMO thin film, picturing their peculiar electrical behaviour between both metallic and insulating phases. The relative error on the thickness measurement between X-ray and ellipsometry is less than 5%. The LSMO complex refractive index enabled also a simultaneous estimation of further material properties, such as the optical gap or the mass density , determined with less than 1.5% relative error compared to X-ray reflectivity results, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Dateibeschreibung: application/pdf

Zugangs-URL: https://hdl.handle.net/20.500.14243/518666
https://doi.org/10.1016/j.apsusc.2024.160489
https://www.sciencedirect.com/science/article/pii/S0169433224012029

X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

Autoren: Konovalov, Oleg Belova, Valentina La Porta, Francesco et al.

Weitere Verfasser: Konovalov, Oleg Belova, Valentina La Porta, Francesco et al.

Quelle: J Synchrotron Radiat
Journal of Synchrotron Radiation, Vol 29, Iss 3, Pp 711-720 (2022)
Journal of synchrotron radiation 29(3), 711-720 (2022). doi:10.1107/S1600577522002053
Journal of Synchrotron Radiation

Schlagwörter: Crystallography, curved surfaces, QC770-798, Research Papers, 01 natural sciences, [PHYS.PHYS.PHYS-CHEM-PH] Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph], methods, QD901-999, Nuclear and particle physics. Atomic energy. Radioactivity, x-ray reflectivity, synchrotron, 0103 physical sciences, [PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph], 0105 earth and related environmental sciences

Dateibeschreibung: application/pdf

Zugangs-URL: https://pubmed.ncbi.nlm.nih.gov/35511004
https://doaj.org/article/80ac1c729a6d4e66bb184ecd5712239d
https://bib-pubdb1.desy.de/record/477589
https://hal.science/hal-03635259v1
https://hal.science/hal-03635259v1/document
https://doi.org/10.1107/s1600577522002053
https://hdl.handle.net/1887/3512613

Data flow from instrument to publication; an X-ray experimentalist view on data generation, processing and analysis

Autoren: Jordt, Philipp Hövelmann, Svenja Carolin Hayen, Nicolas et al.

Schlagwörter: X-ray reflectivity, online analysis, metadata catalogue, FAIR, maschine learning

Zugangs-URL: https://repository.publisso.de/resource/frl:6488507

The effect of temperature on supported dipalmitoylphosphatidylcholine (DPPC) bilayers: Structure and lubrication performance

Autoren: Wang, Min Zander, Thomas Liu, Xiaoyan et al.

Quelle: Journal of Colloid and Interface Science. 445:84-92

Schlagwörter: Phospholipid bilayer, DPPC, X-ray reflectivity, AFM, Surface forces, Friction, Lubrication, Load bearing capacity

Dateibeschreibung: print

Zugangs-URL: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-6792
https://doi.org/10.1016/j.jcis.2014.12.042