Search Results - "Self-testing algorithm"

Self-testing Algorithm of Metro One-button Switch Station Equipment Based on a Neural Network

Authors: Yun Chen Xiaozhou Xu Hao Zhang et al.

Source: Journal of Physics: Conference Series. 2747:012036

Subject Terms: 0301 basic medicine, 03 medical and health sciences, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology

A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis

Authors: Chin-Long Wey

Source: Testing and Diagnosis of Analog Circuits and Systems ISBN: 9781461597490

Access URL: https://link.springer.com/content/pdf/10.1007%2F978-1-4615-9747-6_6.pdf
https://link.springer.com/chapter/10.1007%2F978-1-4615-9747-6_6
https://rd.springer.com/chapter/10.1007/978-1-4615-9747-6_6

Self-testing Algorithm of Metro One-button Switch Station Equipment Based on a Neural Network.

Authors: Chen, Yun Xu, Xiaozhou Zhang, Hao et al.

Source: Journal of Physics: Conference Series; 2024, Vol. 2747 Issue 1, p1-16, 16p

A Self-Tester for Linear Functions over the Integers with an Elementary Proof of Correctness.

Authors: Devadas, Sheela Rubinfeld, Ronitt

Source: Theory of Computing Systems; Jul2016, Vol. 59 Issue 1, p99-111, 13p

Subject Terms: LINEAR algebra, FUNCTIONAL analysis, VECTOR spaces, HOMOMORPHISMS, MATHEMATIC morphism

Conditional local self-regulation rules and a diagnostic algorithm for a multiprocessor system with circulant diagnostic structure based on these rules.

Authors: Dimitriev, Yu.

Source: Automation & Remote Control; May2012, Vol. 73 Issue 5, p862-872, 11p

Subject Terms: UNITS of measurement, ALGORITHMS, COMPUTER programming, FOUNDATIONS of arithmetic

Computer generation of topological equations and pseudocircuits for the self testing analogue fault diagnosis algorithm.

Authors: Wu, C.-C. Wu, Y.-Y.

Source: IEE Proceedings: Part G: Electronic Circuits & Systems; Dec1986, Vol. 133 Issue 6, p273-278, 6p

A Self-Tester for Linear Functions over the Integers with an Elementary Proof of Correctness

Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Department of Mathematics et al.

Source: Springer US

Index Terms: Article, http://purl.org/eprint/type/JournalArticle

URL: http://hdl.handle.net/1721.1/103636
https://orcid.org/0000-0001-8253-7714
https://orcid.org/0000-0002-4353-7639
http://dx.doi.org/10.1007/s00224-015-9639-z
Theory of Computing Systems

A self-testing and calibration technique for current-steering DACs.

Authors: Yuan-Lang Ma Jiun-Lang Huang

Source: 2008 IEEE International Symposium on VLSI Design, Automation & Test (VLSI-DAT); 2008, p295-298, 4p

A Self-Tester for Linear Functions over the Integers with an Elementary Proof of Correctness

Authors: Devadas, Sheela Rubinfeld, Ronitt

Index Terms: Computer Science - Computational Complexity, Computer Science - Data Structures and Algorithms, text

URL: http://arxiv.org/abs/1412.5484

Security Evaluation Method of Smart Home Cloud Platform.

Authors: Wu, Chensi Yang, Lulin Cai, Maobin et al.

Source: International Journal of Pattern Recognition & Artificial Intelligence; May2023, Vol. 37 Issue 6, p1-23, 23p

Subject Terms: SMART homes, CLOUD computing, EVALUATION methodology, ARTIFICIAL intelligence, HOME wireless technology, SERVICE design, COMPUTER network security

Test point selection methods for the self-testing based analogue fault diagnosis system.

Authors: Wu, C.C.

Source: IEE Proceedings: Part G: Electronic Circuits & Systems; Oct1985, Vol. 132 Issue 5, p173-183, 11p

Design of self-testable wafer-scale processor arrays.

Authors: Yoon-Hwa Choi

Source: International Journal of Electronics; Nov90, Vol. 69 Issue 5, p665, 7p, 7 Diagrams, 2 Charts, 2 Graphs

Subject Terms: ARRAY processors, SEMICONDUCTOR wafers

Analyzing and improving tools for supporting fighting against COVID-19 based on prediction models and contact tracing.

Authors: GRUDA, Martyna KEDZIORA, Michal

Source: Bulletin of the Polish Academy of Sciences: Technical Sciences; Aug2021, Vol. 69 Issue 4, p1-10, 10p

Subject Terms: CONTACT tracing, COVID-19, PREDICTION models, PANDEMICS, PROOF of concept

An Improved Fault Propagation Analysis Method Based on Small-world Algorithm for Large Scale Electronic Systems.

Authors: Quan Zhou Hui Zhao Huijie Zhang et al.

Source: Telkomnika; Jun2016, Vol. 14 Issue 2A, p152-161, 10p

Subject Terms: ELECTRIC fault location, ELECTRONIC systems, RELIABILITY in engineering, RADAR transmitters, NUMERICAL calculations

Network traffic classification — A comparative study of two common decision tree methods: C4.5 and Random forest.

Authors: Munther, Alhamza Alalousi, Alabass Nizam, Shahrul et al.

Source: 2014 2nd International Conference on Electronic Design (ICED); 2014, p210-214, 5p

ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs.

Authors: Naghmeh Karimi Shahrzad Mirkhani Zainalabedin Navabi

Source: 2006 15th Asian Test Symposium; 2006, p195-202, 8p

A Distributed Functional Diagnostic System for Multi-Computer Systems.

Authors: Grishin, V. Lobanov, A. Sirenko, V.

Source: Automation & Remote Control; Jan2002, Vol. 63 Issue 1, p139-144, 6p

ATPRG: An Automatic Test Program Generator Using HDL-A for Fault Diagnosis of Analog/Mixed-Signal...

Authors: Huang, Wei-Hsing Wey, Chin-Long

Source: IEEE Transactions on Instrumentation & Measurement; Apr98, Vol. 47 Issue 2, p426, 6p, 4 Diagrams

Subject Terms: COMPUTER hardware description languages, INTEGRATED circuits, FAULT-tolerant computing

Redesignability Check for Analog Circuits with Incomplete Implementation Information.

Authors: Wey, Chin-Long Huang, Wei-Hsing

Source: IEEE Transactions on Circuits & Systems Part I: Fundamental Theory & Applications; Aug1999, Vol. 46 Issue 8, p939, 11p, 7 Diagrams, 2 Charts

Subject Terms: ELECTRONIC circuit design, ALGORITHMS, MATHEMATICAL models

Diagnosability analysis of analogue circuits.

Authors: Huang, Wei-Hsing Wey, Chin-Long

Source: International Journal of Circuit Theory & Applications; Sep1998, Vol. 26 Issue 5, p439-451, 13p