Výsledky vyhledávání - "Scanning X-Ray Diffraction"
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Zdroj: Journal of Synchrotron Radiation. 28:1935-1947
Témata: hard X-ray nanoprobes, coherent diffractive imaging, scanning X-ray microscopy, scanning X-ray diffraction
Popis souboru: print
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Přispěvatelé: a další
Zdroj: ISSN: 1862-6254.
Témata: X-ray imaging, X-ray diffraction, V-pits, strain engineering, scanning X-ray diffraction microscopy, light-emitting diodes, InGaN, [PHYS]Physics [physics]
Dostupnost: https://hal.science/hal-05149618
https://hal.science/hal-05149618v1/document
https://hal.science/hal-05149618v1/file/Physica%20Rapid%20Research%20Ltrs%20-%202024%20-%20Zatterin%20-%20Nanoscale%20Mapping%20of%20the%20Structural%20Relaxation%20in%20Microstructured%20InxGa1%20xN.pdf
https://doi.org/10.1002/pssr.202400241 -
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Zdroj: Plant Methods, Vol 19, Iss 1, Pp 1-10 (2023)
Témata: Scanning X-ray diffraction, Nanodiffraction, Tension wood, Phloem fibre, Cellulose microfibril, MFA, Plant culture, SB1-1110, Biology (General), QH301-705.5
Popis souboru: electronic resource
Relation: https://doaj.org/toc/1746-4811
Přístupová URL adresa: https://doaj.org/article/8028543c27db4e81afd04b5019879852
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Zdroj: J Synchrotron Radiat
Journal of Synchrotron Radiation, Vol 29, Iss 3, Pp 876-887 (2022)Témata: instrumentation, coherent x-rays, Crystallography, QD901-999, Nuclear and particle physics. Atomic energy. Radioactivity, 0103 physical sciences, x-ray imaging, hard x-ray nanoprobes, scanning x-ray diffraction, Beamlines, QC770-798, 01 natural sciences, 0105 earth and related environmental sciences
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Zdroj: J Synchrotron Radiat
Journal of Synchrotron Radiation, Vol 29, Iss 2, Pp 480-487 (2022)
Journal of Synchrotron RadiationTémata: 0301 basic medicine, Microscopy, 0303 health sciences, Crystallography, Atomic, molecular and optical physics, Australia, FOS: Physical sciences, QC770-798, Condensed matter physics, phase-contrast imaging, Research Papers, ultramicroscopy, Physical sciences, 03 medical and health sciences, scanning x-ray diffraction microscopy, Physical chemistry, coherent diffractive imaging, QD901-999, Nuclear and particle physics. Atomic energy. Radioactivity, ptychography, Synchrotrons
Popis souboru: application/pdf
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Zdroj: J Appl Crystallogr
'Journal of Applied Crystallography ', vol: 54, pages: 1057-1070 (2021)Témata: Condensed Matter - Materials Science, Gaussian processes, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, 02 engineering and technology, Research Papers, 01 natural sciences, intragranular strain, 0104 chemical sciences, Physics - Data Analysis, Statistics and Probability, three-dimensional X-ray diffraction (3DXRD), 0210 nano-technology, scanning X-ray diffraction, Data Analysis, Statistics and Probability (physics.data-an)
Popis souboru: application/pdf
Přístupová URL adresa: https://journals.iucr.org/j/issues/2021/04/00/nb5298/nb5298.pdf
https://pubmed.ncbi.nlm.nih.gov/34429719
http://arxiv.org/abs/2102.11018
https://epn-library.esrf.fr/flora/jsp/index_view_direct_anonymous.jsp?record=doc:PUB_ESRF:59167
https://lup.lub.lu.se/search/publication/cc34fd87-f6cb-4466-8d6e-be9fcf693fde
https://scripts.iucr.org/cgi-bin/paper?nb5298
https://portal.research.lu.se/sv/publications/intragranular-strain-estimation-in-far-field-scanning -x -ray -diffr
https://journals.iucr.org/j/issues/2021/04/00/nb5298/index.html
https://portal.research.lu.se/portal/en/publications/intragranular-strain-estimation-in-farfield-scanning -xray-diffraction -using-a-gaussian-process(cc34fd87-f6cb-4466-8d6e-be9fcf693fde)/bibtex.html
https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8366424
https://arxiv.org/abs/2102.11018
https://ui.adsabs.harvard.edu/abs/2021arXiv210211018H/abstract
http://arxiv.org/pdf/2102.11018.pdf -
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Zdroj: 'Physical Review Applied ', vol: 20, pages: 024056-1-024056-12 (2023)
Physical review applied 20(2), 024056 (2023). doi:10.1103/PhysRevApplied.20.024056
Physical Review AppliedTémata: QUANTUM COMPUTING, Condensed Matter - Materials Science, FINITE ELEMENT METHOD, SCANNING X-RAY DIFFRACTION MICROSCOPY, LATTICE STRAIN, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Physics - Applied Physics, Applied Physics (physics.app-ph), SILICON GERMANIUM
Popis souboru: application/pdf
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Zdroj: J Appl Crystallogr
'Journal of Applied Crystallography ', vol: 53, pages: 58-68 (2020)
Journal of Applied CrystallographyTémata: Crystallography, Nano-electromechanical systems, Nanowires, NEMS, Micro-electromechanical systems, MEMS, Scanning X-ray diffraction microscopy, Lattice tilt and strain mapping, 02 engineering and technology, Research Papers, 7. Clean energy, 01 natural sciences, Chemistry, Chemistry, multidisciplinary, 0103 physical sciences, 0210 nano-technology, multidisciplinary
Popis souboru: application/pdf; pdf
Přístupová URL adresa: https://journals.iucr.org/j/issues/2020/01/00/ks5638/ks5638.pdf
https://pubmed.ncbi.nlm.nih.gov/32047404
https://epn-library.esrf.fr/flora/jsp/index_view_direct_anonymous.jsp?record=doc:PUB_ESRF:54242
https://pubmed.ncbi.nlm.nih.gov/32047404/
https://europepmc.org/article/PMC/PMC6998783
https://doc.rero.ch/record/328183
https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6998783/
https://onlinelibrary.wiley.com/doi/abs/10.1107/S1600576719015504
https://journals.iucr.org/j/issues/2020/01/00/ks5638/ks5638.pdf
http://cdm21054.contentdm.oclc.org/cdm/ref/collection/IR/id/8741
http://doc.rero.ch/record/328183/files/nee_rqt_sm.pdf -
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Témata: Anti-Bacterial Agents/*administration & dosage/pharmacokinetics Bone Cements/*chemistry Calcium Phosphates/*chemistry Drug Carriers Gentamicins/*administration & dosage/pharmacokinetics Microscopy, Electron, Scanning X-Ray Diffraction
Relation: Journal of Pharmaceutical Sciences; https://iris.unil.ch/handle/iris/227534; serval:BIB_92BD1B6F7A82; A1997WX10100007; 9145380
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Zdroj: ACS Applied Materials & Interfaces. 7(17)
Témata: CMOS, strain relaxed SiGe buffer, chemical-mechanical polishing, structure inhomogeneities, scanning X-ray diffraction microscopy, chemical−mechanical polishing, Chemical Sciences, Engineering, Nanoscience & Nanotechnology
Popis souboru: application/pdf
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Témata: Physical chemistry, Physical sciences, Atomic, molecular and optical physics, Condensed matter physics, ptychography, scanning X-ray diffraction microscopy, coherent diffractive imaging, ultramicroscopy, phase-contrast imaging
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Zdroj: Condensed Matter, Vol 7, Iss 56, p 56 (2022)
Témata: oxygen interstitials, quantum wires, critical opalescence, high-temperature superconductivity, scanning X-ray diffraction, lattice effects, Physics, QC1-999
Relation: https://www.mdpi.com/2410-3896/7/4/56; https://doaj.org/toc/2410-3896; https://doaj.org/article/96d6420649fb47c3bb9b333da3a75e54
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Zdroj: Surface and Coatings Technology. 320:158-167
Témata: 0205 materials engineering, 02 engineering and technology, 0210 nano-technology, In situ mechanical microscopy, In situ strain mapping, Nano-multilayer, Scanning X-ray Diffraction Microscopy (SXDM), Shear lag model
Popis souboru: application/pdf
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Zdroj: Crystals, Vol 9, Iss 10, p 500 (2019)
Témata: organic films, magnetic thin films, nanowires, scanning x-ray diffraction, anomalous x-ray diffraction, nanoparticles, quantum dots, grazing incidence small angle x-ray scattering, x-ray beam induced current, Crystallography, QD901-999
Relation: https://www.mdpi.com/2073-4352/9/10/500; https://doaj.org/toc/2073-4352; https://doaj.org/article/b0ff0c1e08194e02b0c25f23fd2e99c8
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Zdroj: Crystals, Vol 9, Iss 8, p 432 (2019)
Témata: X-ray beam induced current (XBIC), scanning X-ray diffraction (XRD), nanowire, Crystallography, QD901-999
Relation: https://www.mdpi.com/2073-4352/9/8/432; https://doaj.org/toc/2073-4352; https://doaj.org/article/4588d34e3ad44da08d6a114e782077d8
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Témata: epitaxially grown quantum dots, single quantum dot, single-photon sources, scanning X-ray diffraction microscopy (SXDM), X-ray fluorescence (XRF), compositional inhomogeneities, nanoscale chirality
Relation: https://zenodo.org/records/13710482; oai:zenodo.org:13710482; https://doi.org/10.5281/zenodo.13710482
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Zdroj: 2023 IEEE International Magnetic Conference - Short Papers, INTERMAG Short Papers 2023 - Proceedings; (2023)
Témata: Condensed Matter Physics (including Material Physics, Nano Physics), Antiferromagnetism, Domain Walls, Photoemission Electron Microscopy, Scanning X-ray Diffraction Microscopy
Relation: http://dx.doi.org/10.1109/INTERMAGShortPapers58606.2023.10228289; scopus:85172727744
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Zdroj: AIMS Materials Science, Vol 2, Iss 4, Pp 369-378 (2015)
'AIMS Materials Science ', vol: 2, pages: 269-278 (2015)
AIMS Materials Science 2(4), 369-378 (2015). doi:10.3934/matersci.2015.4.369 special issue: "X-ray microscopy in Materials Sciences"Témata: multilayer, 02 engineering and technology, focused X-ray, 01 natural sciences, 7. Clean energy, polymorphism, 0104 chemical sciences, scanning X-ray diffraction microscopy, morphology, synchrotron, TA401-492, 0210 nano-technology, Materials of engineering and construction. Mechanics of materials
Popis souboru: application/pdf
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Zdroj: Journal of superconductivity and novel magnetism 25 (2012). doi:10.1007/s10948-012-1524-2
info:cnr-pdr/source/autori:Ricci, A (Ricci, A.)1,2; Poccia, N (Poccia, N.)1; Joseph, B (Joseph, B.)1; Campi, G (Campi, G.)3; Bianconi, A (Bianconi, A.)1/titolo:Phase Separation in Electron Doped Iron-Selenide K0.8Fe1.6Se2 Superconductor by Scanning X-ray Nano-Diffraction/doi:10.1007%2Fs10948-012-1524-2/rivista:Journal of superconductivity and novel magnetism/anno:2012/pagina_da:/pagina_a:/intervallo_pagine:/volume:25
Journal of superconductivity and novel magnetism 25, 1383-1387 (2012). doi:10.1007/s10948-012-1524-2Témata: 0103 physical sciences, Phase separation, High temperature superconductors, Coexistence of magnetism and superconductivity, Scanning X-ray diffraction, Nano X-ray diffraction, 02 engineering and technology, 0210 nano-technology, 01 natural sciences
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Zdroj: New Journal of Physics, Vol 19, Iss 1, p 011002 (2017)
Témata: correlative imaging, scanning x-ray diffraction, fluorescence microscopy, Science, Physics, QC1-999
Relation: https://doi.org/10.1088/1367-2630/19/1/011002; https://doaj.org/toc/1367-2630; https://doaj.org/article/8be1999cd6c84f97992c4559ff9a3140
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