Search Results - "Fault injection analysis"

STDP-Trained Spiking Neural Network Reliability Assessment Through Fault Injections

Authors: Jouni, Zalfa Stratigopoulos, Haralampos-G. Stratigopoulos, Haralampos

Contributors: Jouni, Zalfa Stratigopoulos, Haralampos-G. Stratigopoulos, Haralampos

Source: 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS). :1-8

Subject Terms: [INFO.INFO-AI] Computer Science [cs]/Artificial Intelligence [cs.AI], Spiking neural networks, STDP Spike-Timing Dependant Plasticity, Neuromorphic computing, Fault injection analysis, Reliability, [INFO.INFO-IA] Computer Science [cs]/Computer Aided Engineering

File Description: application/pdf

Access URL: https://hal.science/hal-05083335v1

Combined Threshold Implementation

Authors: Jakob Feldtkeller Jan Richter-Brockmann Pascal Sasdrich et al.

Source: Transactions on Cryptographic Hardware and Embedded Systems, Vol 2024, Iss 4 (2024)

Subject Terms: Fault-Injection Analysis, TK7885-7895, Computer engineering. Computer hardware, Side-Channel Analysis, Hardware Security, Information technology, Physical Security, T58.5-58.64, Threshold Implementation, Consolidating Masking Schemes

Access URL: https://doaj.org/article/ae7eaca3ec8a4f929d2882c7b3951b93

Quasi-linear masking against SCA and FIA, with cost amortization

Authors: Claude Carlet Abderrahman Daif Sylvain Guilley et al.

Source: Transactions on Cryptographic Hardware and Embedded Systems, Vol 2024, Iss 1 (2023)

Subject Terms: TK7885-7895, Frobenius Additive Fast Fourier Transform (FAFFT), Computer engineering. Computer hardware, Strong Non Interference (SNI), Side-channel analysis (SCA), Fault injection analysis (FIA), Information technology, Code-Based Masking (CBM), Fault Detection, T58.5-58.64

Access URL: https://doaj.org/article/643b7c9091d84d6c86cbdf8c1fa2dc70

Fault Injection Analysis of Embedded Cryptography

Authors: Gruber, Michael Sigl, Georg (Prof. Dr.) Dutertre, Jean-Max (Prof.)

Contributors: Gruber, Michael Sigl, Georg (Prof. Dr.) Dutertre, Jean-Max (Prof.)

Subject Terms: Fehlerinjektionsanalyse, Seitenkanalanalyse, Elektromagnetische Fehlerinjektion, Gegenmaßnahmen, Toggle Count Analysis, Ingenieurwissenschaften, Fault Injection Analysis, Side Channel Analysis, Electromagnetic Fault Injection, Countermeasures, Toggle Count Analysis, ddc:620

File Description: application/pdf

Access URL: https://mediatum.ub.tum.de/1740100

Switch-Glitch : Location of Fault Injection Sweet Spots by Electro-Magnetic Emanation

Authors: Probst Matthias and Gruber Michael and Brosch et al.

Subject Terms: info:eu-repo/classification/ddc/620, Ingenieurwissenschaften, Microcontrollers, Fault detection, Switches, Fault location, Vectors, Cryptography, Probes, Heat maps, Space heating, Signal to noise ratio, Probe Positioning, Fault Injection Analysis, Side-Channel Analysis

Relation: https://mediatum.ub.tum.de/1761630

Availability: https://mediatum.ub.tum.de/1761630
https://doi.org/10.1109/FDTC64268.2024.00011

A Deep Learning Approach to Side-Channel Analysis of Cryptographic Hardware

Authors: Ramezanpour, Keyvan

Thesis Advisors: Electrical Engineering, Ampadu, Paul K., Diehl, William J., Ha, Dong S., Butt, Ali, Schaumont, Patrick Robert

Subject Terms: Autoencoder, Deep learning (Machine learning), Fault Injection Analysis, Power Analysis, Reinforcement Learning, Side-Channel Analysis, Unsupervised Learning

File Description: ETD; application/pdf

Availability: http://hdl.handle.net/10919/109013

Fault Injection Analysis of Embedded Cryptography ; Fehlerinjektionsanalyse eingebetteter Kryptografie

Authors: Gruber, Michael Sigl, Georg (Prof. Dr.) Dutertre, Jean-Max (Prof.)

Contributors: Gruber, Michael Sigl, Georg (Prof. Dr.) Dutertre, Jean-Max (Prof.)

Subject Terms: info:eu-repo/classification/ddc/620, Ingenieurwissenschaften, Fault Injection Analysis, Side Channel Analysis, Electromagnetic Fault Injection, Countermeasures, Toggle Count Analysis, Fehlerinjektionsanalyse, Seitenkanalanalyse, Elektromagnetische Fehlerinjektion, Gegenmaßnahmen

File Description: application/pdf

Relation: https://mediatum.ub.tum.de/1740100; https://mediatum.ub.tum.de/doc/1740100/document.pdf

Availability: https://mediatum.ub.tum.de/1740100
https://mediatum.ub.tum.de/doc/1740100/document.pdf
http://nbn-resolving.de/urn:nbn:de:bvb:91-diss-20240920-1740100-1-9

A Deep Learning Approach to Side-Channel Analysis of Cryptographic Hardware

Authors: Ramezanpour, Keyvan Electrical Engineering Ampadu, Paul K. et al.

Contributors: Ramezanpour, Keyvan Electrical Engineering Ampadu, Paul K. et al.

Subject Terms: Deep learning (Machine learning), Side-Channel Analysis, Unsupervised Learning, Autoencoder, Power Analysis, Reinforcement Learning, Fault Injection Analysis

File Description: ETD; application/pdf

Access URL: http://hdl.handle.net/10919/109013

Fault-Injection Analysis to Estimate SEU Failure in Time by Using Frame-Based Partial Reconfiguration

Authors: Masahiro IIDA Morihiro KUGA Motoki AMAGASAKI et al.

Source: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2012, E95.A(12):2347

A Fault Model for Conducted Intentional ElectroMagnetic Interferences

Authors: Sauvage, Laurent Guilley, Sylvain Danger, Jean-Luc et al.

Contributors: Sauvage, Laurent Guilley, Sylvain Danger, Jean-Luc et al.

Source: EMC ; https://hal.telecom-paris.fr/hal-02411875 ; EMC, Aug 2012, Pittsburgh, United States. pp.788-793, ⟨10.1109/ISEMC.2012.6351664⟩

Subject Terms: Fault Injection Analysis, Conducted Intentional ElectroMagnetic Interference, FPGA, DES, [SPI.TRON]Engineering Sciences [physics]/Electronics

Subject Geographic: Pittsburgh, United States

Relation: hal-02411875; https://hal.telecom-paris.fr/hal-02411875

Availability: https://hal.telecom-paris.fr/hal-02411875
https://doi.org/10.1109/ISEMC.2012.6351664

Fault Injection Analysis of Embedded Cryptography

Additional Titles: Fehlerinjektionsanalyse eingebetteter Kryptografie

Authors: Sigl, Georg (Prof. Dr.) Sigl, Georg (Prof. Dr.);Dutertre, Jean-Max (Prof.) Gruber, Michael

Index Terms: info:eu-repo/classification/ddc/620, Ingenieurwissenschaften, Fault Injection Analysis, Side Channel Analysis, Electromagnetic Fault Injection, Countermeasures, Toggle Count Analysis, Fehlerinjektionsanalyse, Seitenkanalanalyse, Elektromagnetische Fehlerinjektion, Gegenmaßnahmen, Toggle Count Analysis, thesis, doc-type:doctoralThesis

URL: https://mediatum.ub.tum.de/1740100
https://mediatum.ub.tum.de/doc/1740100/document.pdf
http://nbn-resolving.de/urn:nbn:de:bvb:91-diss-20240920-1740100-1-9