Suchergebnisse - "Extended MC integration algorithm"

Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors

Autoren: Hao, Songhua Yang, Jun Bérenguer, Christophe et al.

Weitere Verfasser: Hao, Songhua Yang, Jun Bérenguer, Christophe et al.

Quelle: Reliability Engineering & System Safety. 189:261-270

Schlagwörter: Measurement errors, [STAT.AP]Statistics [stat]/Applications [stat.AP], Skew-normal random effects, Extended inverse Gaussian process model, 0211 other engineering and technologies, 02 engineering and technology, 0101 mathematics, the MLE method, Extended MC integration algorithm, 01 natural sciences, [SPI.AUTO]Engineering Sciences [physics]/Automatic

Zugangs-URL: https://hal.archives-ouvertes.fr/hal-02121916/file/RESS2019_Hao%5BDepotHAL%5D.pdf
https://hal.archives-ouvertes.fr/hal-02121916
https://hal.archives-ouvertes.fr/hal-02121916/document
https://doi.org/10.1016/j.ress.2019.04.031
https://ideas.repec.org/a/eee/reensy/v189y2019icp261-270.html
https://www.sciencedirect.com/science/article/pii/S095183201831442X

Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors

Autoren: Hao, Songhua Yang, Jun Berenguer, Christophe

Relation: http://www.sciencedirect.com/science/article/pii/S095183201831442X

Verfügbarkeit: http://www.sciencedirect.com/science/article/pii/S095183201831442X