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    Contributors: Shien Zhu Luan H. K. Duong Hui Chen et al.

    Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42:781-794

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    Contributors: Jakub Breier Dirmanto Jap Xiaolu Hou et al.

    Source: IEEE Transactions on Reliability. 71:1527-1539

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