Výsledky vyhľadávania - "Computer systems organization Dependable and fault-tolerant systems and networks Reliability"

Fault Monitoring with Sequential Matrix Factorization

Autori: Germain, Cecile Feng, Dawei

Prispievatelia: Germain, Cecile Feng, Dawei

Zdroj: OpenAIRE

Predmety: [Com-puter systems organization]: Dependable and fault-tolerant systems and networks—Availability General Terms: Grids and Clouds, 2. Zero hunger, Active Learning ACM Reference Format, [INFO.INFO-DC] Computer Science [cs]/Distributed, Parallel, and Cluster Computing [cs.DC], 0202 electrical engineering, electronic engineering, information engineering, Matrix Factorization, [INFO.INFO-LG] Computer Science [cs]/Machine Learning [cs.LG], 02 engineering and technology, 16. Peace & justice, Categories and Subject Descriptors: [Computer systems organization]: Dependable and fault-tolerant systems and networks—Reliability, Machine Learning Additional Key Words and Phrases: Fault Inference

Popis súboru: application/pdf

Prístupová URL adresa: https://hal.inria.fr/hal-01176013/file/taasseqmAV.pdf
https://inria.hal.science/hal-01176013v1/document
https://inria.hal.science/hal-01176013v1
https://doi.org/10.1145/2797141
http://dblp.uni-trier.de/db/journals/taas/taas10.html#FengG15
https://dl.acm.org/doi/10.1145/2797141
https://hal.inria.fr/hal-01176013
https://hal.inria.fr/hal-01176013/document
https://dblp.uni-trier.de/db/journals/taas/taas10.html#FengG15
https://hal.inria.fr/hal-01176013/document
https://hal.inria.fr/hal-01176013
https://hal.inria.fr/hal-01176013/file/taasseqmAV.pdf

Fault Monitoring with Sequential Matrix Factorization.

Autori: DAWEI FENG GERMAIN, CECILE

Zdroj: ACM Transactions on Autonomous & Adaptive Systems; Aug2015, Vol. 10 Issue 3, p20:1-20:25, 25p

Predmety: SEQUENTIAL analysis, MATRICES (Mathematics), FACTORIZATION, HEURISTIC, ACTIVE learning

Application-aware cross-layer reliability analysis and optimization.

Autori: Glaß, Michael Aliee, Hananeh Chen, Liang a ďalší

Zdroj: IT: Information Technology; Jun2015, Vol. 57 Issue 3, p159-169, 11p

Predmety: COMPUTER reliability, SEMICONDUCTORS, ENERGY consumption, MIMO systems, INTEGRATED circuits, DISTRIBUTED computing