Search Results - "Analog and mixed-signal circuits"
-
1
Authors: et al.
Contributors: et al.
Source: 2025 IEEE International Symposium on Circuits and Systems (ISCAS). :1-5
Subject Terms: Piracy, Locking, Analog and mixed-signal circuits, Bandgap reference circuits, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Counterfeiting, Hardware security and trust, [INFO.INFO-CR] Computer Science [cs]/Cryptography and Security [cs.CR]
File Description: application/pdf
Access URL: https://hal.science/hal-04938873v1
-
2
Authors:
Subject Terms: IoT, analog and mixed-signal circuits, Digital-based (DB) Continuous-Time (CT) Sigma Delta Analog-to-digital converters (ADCs)
File Description: application/pdf
-
3
Authors: et al.
Source: IEEE Transactions on Circuits and Systems II: Express Briefs. 68:816-822
Subject Terms: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Digital-based analog processing, analog and mixed signal circuits, dyadic digital pulse modulation (DDPM), digital-to-analog converter (DAC), virtual voltage reference, digital operational transconductance amplifier (DIGOTA), relaxation DAC (ReDAC)
File Description: application/pdf
Access URL: https://ieeexplore.ieee.org/document/9314920
https://doi.org/10.1109/TCSII.2021.3049680
https://dblp.uni-trier.de/db/journals/tcasII/tcasII68.html#ToledoRMC21
https://iris.polito.it/handle/11583/2860335
https://hdl.handle.net/11583/2860335
https://ieeexplore.ieee.org/document/9314920
https://doi.org/10.1109/TCSII.2021.3049680 -
4
Authors: et al.
Contributors: et al.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 28:582-590
Subject Terms: PACS 85.42, 0202 electrical engineering, electronic engineering, information engineering, Build-in Self Test, 02 engineering and technology, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, analog and mixed-signal circuits
Access URL: https://dblp.uni-trier.de/db/journals/tcad/tcad28.html#StratigopoulosMB09
https://ieeexplore.ieee.org/document/4802222/
http://ieeexplore.ieee.org/document/4802222/
http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000004802222
https://hal.archives-ouvertes.fr/hal-00379139
https://www.infona.pl/resource/bwmeta1.element.ieee-art-000004802222 -
5
Authors: et al.
Source: IEEE Transactions on Reliability. 52:444-457
Subject Terms: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Analog and mixed-signal circuits, Chirp, Digital signal generation and analysis, Electronic testing
Access URL: https://mro.massey.ac.nz/bitstream/10179/9640/1/01260595.pdf
https://mro.massey.ac.nz/handle/10179/9640
https://dblp.uni-trier.de/db/journals/tr/tr52.html#AllenBDP03
https://www-ist.massey.ac.nz/dbailey/sprg/pdfs/2003_TranRel_444.pdf
https://ieeexplore.ieee.org/document/1260595/
https://air.unimi.it/handle/2434/142552
http://sprg.massey.ac.nz/pdfs/2003_TranRel_444.pdf -
6
Authors: et al.
Contributors: et al.
Subject Terms: Analog and mixed-signal circuits, Machine learning, Design automation
File Description: application/pdf
-
7
Authors: et al.
Contributors: et al.
Subject Terms: Signal Temporal Logic, Cyber-Physical Systems, Model Verification and Validation, Fault Localization, Failure Explanation, Property Mining, Coverage Analysis, Adaptive Testing, Cooperative Games, Analog and Mixed Signal Circuits
File Description: 52 Seiten
Relation: https://doi.org/10.34726/hss.2021.88181; http://hdl.handle.net/20.500.12708/17417; AC16200152
-
8
Authors: et al.
Contributors: et al.
Source: https://theses.hal.science/tel-03681806 ; Cryptography and Security [cs.CR]. Sorbonne Université, 2021. English. ⟨NNT : 2021SORUS246⟩.
Subject Terms: Hardware security, Analog and mixed-signal circuits, Intellectual property protection, Logic locking, Sécurité matérielle, Circuits analogiques et mixtes, Protection propriété intellectuelle, Anti contrefaçon et anti rétro-ingénierie, Offuscation, [INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR], [INFO.INFO-IA]Computer Science [cs]/Computer Aided Engineering
Relation: NNT: 2021SORUS246
-
9
Authors: et al.
Contributors: et al.
Source: Design, Automation and Test in Europe (DATE'98) ; https://hal.science/hal-01357223 ; Design, Automation and Test in Europe (DATE'98), Feb 1998, Paris, France. pp.987-988
Subject Terms: testability of analog and mixed signal circuits, built-in self test, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Relation: hal-01357223; https://hal.science/hal-01357223
Availability: https://hal.science/hal-01357223
-
10
Authors:
Contributors:
Subject Terms: Circuits analogiques et mixtes, Hardware security, Analog and mixed-signal circuits, Offuscation, Protection propriété intellectuelle, Logic locking, Anti contrefaçon et anti rétro-ingénierie, Sécurité matérielle, Intellectual property protection, [INFO.INFO-IA] Computer Science [cs]/Computer Aided Engineering, [INFO.INFO-CR] Computer Science [cs]/Cryptography and Security [cs.CR]
File Description: application/pdf
Access URL: https://theses.hal.science/tel-03681806v2
-
11
Authors:
Contributors:
Source: IEEE 3rd Asian Test Symposium (ATS'94) ; https://hal.science/hal-01357225 ; IEEE 3rd Asian Test Symposium (ATS'94), Nov 1994, Nara, Japan. pp.45-50
Subject Terms: testability of analog and mixed signal circuits, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-01357225
-
12
Authors:
Source: Journal of the Brazilian Computer Society v.4 n.2 1997
Journal of the Brazilian Computer Society
Sociedade Brasileira de Computação (SBC)
instacron:UFRGS
Repositório Institucional da UFRGS
Universidade Federal do Rio Grande do Sul (UFRGS)
Journal of the Brazilian Computer Society, Volume: 4, Issue: 2, Pages: 1-2, Published: NOV 1997Subject Terms: Analog and Mixed-signal Circuits, Testes : Circuitos analogicos, Computer-Aided Testing, Cad : Microeletronica, Analog and mixed-signal circuits, 0202 electrical engineering, electronic engineering, information engineering, Automatic test generation, Computer-aided testing, 02 engineering and technology, Automatic Test Generation
File Description: text/html; application/pdf
Access URL: https://www.lume.ufrgs.br/handle/10183/72561
https://www.scielo.br/j/jbcos/a/9WbKwFHdkJTRpSjssY5LxtN/
http://www.scielo.br/j/jbcos/a/9WbKwFHdkJTRpSjssY5LxtN/
https://www.lume.ufrgs.br/bitstream/handle/10183/72561/000154804.pdf;sequence=1
https://dblp.uni-trier.de/db/journals/jbcs/jbcs4.html#CotaDL97
https://www.scielo.br/scielo.php?script=sci_arttext&pid=S0104-65001997000300001&lng=en&tlng=en
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0104-65001997000300001
http://hdl.handle.net/10183/72561
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0104-65001997000300001&lng=en&tlng=en -
13
Authors:
Contributors:
Source: Proc. of PhD Forum at IEEE Design, Automation and Test in Europe Conference ; PhD Forum at IEEE Design, Automation and Test in Europe Conference, Grenoble ; https://hal.science/hal-00652920 ; PhD Forum at IEEE Design, Automation and Test in Europe Conference, Grenoble, Mar 2011, Grenoble, France
Subject Terms: test, analog and mixed-signal circuits, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-00652920
-
14
Authors:
Contributors:
Source: 16th IEEE International On-Line Testing Symposium (IOLTS'10)
https://hal.science/hal-00549701
16th IEEE International On-Line Testing Symposium (IOLTS'10), Jul 2010, Corfy, GreeceSubject Terms: analog and mixed-signal circuits, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-00549701
-
15
Authors:
Contributors:
Subject Terms: Sintetizadores de frequencia, Circuitos integrados, CMOS, PLL, Frequency synthesizer, Analog and mixed-signal circuits, Integrated circuits, Digital techniques, RF
Relation: http://hdl.handle.net/11449/100280; http://acervodigital.unesp.br/handle/11449/100280; oliveira_vjs_dr_ilha.pdf; 000623169; 33004099080P0
-
16
Authors: et al.
Contributors: et al.
Source: https://hal.science/hal-00017266 ; 239 p., 1999.
Subject Terms: On-line testing, Concurrent checking, Self-Checking digital, analog and mixed-signal circuits, On-line and Off-line BIST, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-00017266
-
17
Authors: et al.
Contributors: et al.
Source: https://hal.science/hal-00016707 ; Elsevier, Issues 1-2 November, 157 p., 1998.
Subject Terms: testability of analog and mixed signal circuits, thermal modeling, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-00016707
-
18
Authors: et al.
Contributors: et al.
Source: https://hal.science/hal-00017280 ; IEEE, 260 p., 1998.
Subject Terms: Concurrent checking, Periodic testing in the field Field Diagnosis, Self-Checking digital, analog and mixed-signal circuits, Coding theory, On-line and Off-line BIST, Synthesis of on-line testable circuits, Radiation hardened/tolerant processes and design techniques, Sensors/detectors for on-line monitoring of current, temperature and other reliability relevant parameters, Fault-tolerant and fail-safe systems, On-line testing in automotive, railway, avionics, industrial control and space applications, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-00017280
-
19
Authors: et al.
Contributors: et al.
Source: https://hal.science/hal-00017272 ; IEEE, 267 p., 1997.
Subject Terms: Concurrent checking, Periodic testing in the field Field diagnosis, Self-checking digital, analog and mixed-signal circuits, Coding theory, On-line and off-line BIST, Synthesis of on-line testable circuits Radiation hardened/tolerant processes and design techniques, Sensors/detectors for on-line monitoring of current, temperature and other reliability relevant parameters, Fault-tolerant and fail-safe systems On-line testing in automotive, railway, avionics, industrial control and space applications, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Availability: https://hal.science/hal-00017272
-
20
Thesis Advisors: Universidade Estadual Paulista (UNESP), Oki, Nobuo [UNESP]
Source: AlephRepositório Institucional da UNESPUniversidade Estadual PaulistaUNESP.
Subject Terms: Sintetizadores de frequencia, Circuitos integrados, CMOS, PLL, Frequency synthesizer, Analog and mixed-signal circuits, Integrated circuits, Digital techniques, RF
File Description: 163 f. : il.
Relation: -1
Availability: http://hdl.handle.net/11449/100280
Nájsť tento článok vo Web of Science 
Full Text Finder