Search Results - "ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics"
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1
Authors: et al.
Contributors: et al.
Source: SANER 2021 - 28th IEEE International Conference on Software Analysis, Evolution and Reengineering ; https://hal.science/hal-03447628 ; SANER 2021 - 28th IEEE International Conference on Software Analysis, Evolution and Reengineering, Mar 2021, Honolulu / Virtual, United States. pp.131-141, ⟨10.1109/SANER50967.2021.00021⟩ ; https://saner2021.shidler.hawaii.edu
Subject Terms: binary code analysis, graph neural networks, toolchain provenance, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.7: Distribution, Maintenance, and Enhancement/D.2.7.5: Restructuring, reverse engineering, and reengineering, ACM: I.: Computing Methodologies/I.2: ARTIFICIAL INTELLIGENCE/I.2.6: Learning, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, [INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR], [INFO.INFO-LG]Computer Science [cs]/Machine Learning [cs.LG]
Subject Geographic: Honolulu / Virtual, United States
Relation: info:eu-repo/grantAgreement//830927/EU/Cyber security cOmpeteNCe fOr Research anD InnovAtion/CONCORDIA
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2
Authors: et al.
Contributors: et al.
Source: MLPA 2020 - Machine Learning for Program Analysis ; https://hal.science/hal-03270335 ; MLPA 2020 - Machine Learning for Program Analysis, Jan 2021, Yokohama / Virtual, Japan ; https://sites.google.com/view/mlpa2020
Subject Terms: toolchain provenance, machine learning, reverse engineering, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.7: Distribution, Maintenance, and Enhancement/D.2.7.5: Restructuring, and reengineering, ACM: I.: Computing Methodologies/I.2: ARTIFICIAL INTELLIGENCE/I.2.6: Learning, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, [INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR], [INFO.INFO-LG]Computer Science [cs]/Machine Learning [cs.LG]
Subject Geographic: Yokohama / Virtual, Japan
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3
Authors: et al.
Contributors: et al.
Source: JDEV ; https://hal.science/hal-02899373 ; JDEV, Jul 2020, RENNES, France
Subject Terms: ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.8: Validation, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.8: Testing tools (e.g., data generators, coverage testing), ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.6: Programming Environments/D.2.6.1: Integrated environments, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.9: Management/D.2.9.2: Life cycle, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.9: Management/D.2.9.7: Software quality assurance (SQA), [INFO.INFO-CL]Computer Science [cs]/Computation and Language [cs.CL], [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
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4
Authors: et al.
Contributors: et al.
Source: Fault Diagnosis of Hybrid Dynamic and Complex Systems ; https://hal.science/hal-01905006 ; Moamar Sayed-Mouchaweh. Fault Diagnosis of Hybrid Dynamic and Complex Systems, Springer Verlag, pp.209-241, 2018, 978-3-319-74013-3. ⟨10.1007/978-3-319-74014-0_9⟩ ; https://link.springer.com/chapter/10.1007/978-3-319-74014-0_9https://link.springer.com/chapter/10.1007/978-3-319-74014-0_9
Subject Terms: ACM: B.: Hardware/B.4: INPUT/OUTPUT AND DATA COMMUNICATIONS/B.4.5: Reliability, Testing, and Fault-Tolerance/B.4.5.1: Diagnostics, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, [SPI.AUTO]Engineering Sciences [physics]/Automatic, [INFO.INFO-AI]Computer Science [cs]/Artificial Intelligence [cs.AI], [INFO.INFO-AU]Computer Science [cs]/Automatic Control Engineering, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems
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5
Authors: et al.
Contributors: et al.
Source: 15th International Conference on Software Engineering and Formal Methods, SEFM 2017
https://hal.science/hal-01559688
15th International Conference on Software Engineering and Formal Methods, SEFM 2017, Sep 2017, Trente, Italy. Short Papers 1-6
http://sefm17.fbk.eu/Subject Terms: Framework, Critical systems, Verification, Diagnosis, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.4: Model checking, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
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6
Authors: et al.
Contributors: et al.
Source: https://inria.hal.science/inria-00266555 ; [Research Report] RR-6501, INRIA. 2008.
Subject Terms: Aspect-oriented programming, Classification system, Invasive AOP, program reasoning, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.1: Requirements/Specifications/D.2.1.2: Methodologies (e.g., object-oriented, structured), ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.8: Validation, [INFO.INFO-PL]Computer Science [cs]/Programming Languages [cs.PL], [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
Relation: info:eu-repo/semantics/altIdentifier/arxiv/0804.1696; ARXIV: 0804.1696
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7
Authors: et al.
Contributors: et al.
Source: 2nd International Workshop on Causal Reasoning for Embedded and safety-critical Systems Technologies (CREST 2017)
https://inria.hal.science/hal-01631415
2nd International Workshop on Causal Reasoning for Embedded and safety-critical Systems Technologies (CREST 2017), 2017, Uppsala, Sweden. pp.47 - 53, ⟨10.4204/EPTCS.259.5⟩Subject Terms: ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems, [INFO.INFO-AI]Computer Science [cs]/Artificial Intelligence [cs.AI]
Relation: info:eu-repo/semantics/altIdentifier/arxiv/1710.03393; ARXIV: 1710.03393
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8
Authors: et al.
Contributors: et al.
Source: International Conference on Logic Programming ; https://inria.hal.science/hal-00756836 ; International Conference on Logic Programming, 2003, Mumbay, India
Subject Terms: ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.2: Diagnostics, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging/D.2.5.9: Tracing, ACM: D.: Software/D.3: PROGRAMMING LANGUAGES/D.3.2: Language Classifications/D.3.2.2: Constraint and logic languages, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE], [INFO.INFO-PL]Computer Science [cs]/Programming Languages [cs.PL]
Availability: https://inria.hal.science/hal-00756836
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